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Diagnostics for an for an XUV/soft x-ray laser

Journal Article · · AIP Conf. Proc.; (United States)
DOI:https://doi.org/10.1063/1.34683· OSTI ID:6460937
We have begun investigating the production of an XUV/soft x-ray laser, using our high-powered glass lasers as drivers. A major diagnostic for lasing is the measure of the absolute power produced in the lasing line. I have developed a spectrography to time-resolve lasing lines in the energy range from 50 eV to greater than 200 eV. The spectrograph combines a transmission grating and x-ray streak camera to produce a flat field in the energy range from 50 eV to greater than 200 eV. The spectrograph combines a transmission grating and x-ray streak camera to produce a flat field instrument. A cylindrical mirror is used in front of the grating to image the source and act as a collecting optic. The efficiency of the components is calibrated so that absolute intensities can be measured. I will compare the performance of this instrument with reflection grating systems. I will also discuss planned improvements to the system which should increase total throughput, image quality, and resolving power.
Research Organization:
Lawrence Livermore National Laboratory, Livermore, CA 94550
OSTI ID:
6460937
Journal Information:
AIP Conf. Proc.; (United States), Journal Name: AIP Conf. Proc.; (United States) Vol. 119:1; ISSN APCPC
Country of Publication:
United States
Language:
English