Instrument and method for focusing x rays, gamma rays, and neutrons

Patent · Thu Mar 25 04:00:00 EST 1982

OSTI ID:6458937

Smither, R K

A crystal-diffraction instrument or diffraction-grating instrument is described with an improved crystalline structure or grating spacing structure having a face for receiving a beam of photons or neutrons and diffraction planar spacing or grating spacing along that face with the spacing increasing progressively along the face to provide a decreasing Bragg diffraction angle for a monochromatic radiation and thereby increasing the usable area and acceptance angle. The increased planar spacing for the diffraction crystal is provided by the use of a temperature differential across the line structures with different compositions, by an individual crystalline structure with a varying composition and thereby a changing planar spacing along its face, and by combinations of these techniques. The increased diffraction grating element spacing is generated during the fabrication of the diffraction grating by controlling the cutting tool that is cutting the grooves or controlling the laser beam, electron beam, or ion beam that is exposing the resist layer, etc. It is also possible to vary this variation in grating spacing by applying a thermal gradient to the diffraction grating in much the same manner as is done in the crystal-diffraction case.

• DOE Contract Number: W-31109-ENG-38
• Assignee: ERA-08-018557; EDB-83-051630
• Patent Number(s): None
• Application Number: ON: DE83006881
• OSTI ID: 6458937
• Country of Publication: United States
• Language: English

Related Subjects

440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
654001 -- Radiation & Shielding Physics-- Radiation Physics
Shielding Calculations & Experiments
654003 -- Radiation & Shielding Physics-- Neutron Interactions with Matter
73 NUCLEAR PHYSICS AND RADIATION PHYSICS
BEAMS
BRAGG REFLECTION
COHERENT SCATTERING
CRYSTALS
DIFFRACTION
DIFFRACTOMETERS
ELECTROMAGNETIC RADIATION
FABRICATION
FOCUSING
GAMMA RADIATION
GRATINGS
IONIZING RADIATIONS
MEASURING INSTRUMENTS
MONOCHROMATORS
MONOCRYSTALS
NEUTRON BEAMS
NEUTRON DIFFRACTION
NEUTRON DIFFRACTOMETERS
NUCLEON BEAMS
PARTICLE BEAMS
RADIATIONS
REFLECTION
SCATTERING
X RADIATION
X-RAY DIFFRACTION
X-RAY DIFFRACTOMETERS