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Title: Band-gap narrowing and III-V heterostructure FETs (Field-Effect Transistors)

Conference ·
OSTI ID:6455495
; ; ;  [1];  [2]
  1. Sandia National Labs., Albuquerque, NM (USA)
  2. National Inst. of Standards and Technology (NCTL), Gaithersburg, MD (USA)

We calculate the magnitude of band-gap narrowing for GaAs-based alloys, and have included these results into one-dimensional heterojunction device models for strained In{sub 0.15}Ga{sub 0.85}As quantum-well MODulation-doped Field-Effect Transistors (MODFETs). Equivalent rigid shifts of as much as 1.2 meV are obtained for the valence band of depleted p-type Al{sub 0.15}Ga{sub 0.85}As doped at 5 {times} 10{sup 18}/cm{sup 3}. Our simulations suggest that band-gap narrowing is most significant for p-channel MODFETs. The predicted effect of band-gap narrowing in p-channel MODFETs is the formation of parasitic conduction in the low-mobility parent dopant region. The parasitic conduction would reduce the intrinsic gain. 13 refs., 4 figs.

Research Organization:
Sandia National Labs., Albuquerque, NM (USA)
Sponsoring Organization:
DOE/DP
DOE Contract Number:
AC04-76DP00789
OSTI ID:
6455495
Report Number(s):
SAND-90-1911C; CONF-901244-1; ON: DE91000401
Resource Relation:
Conference: 1990 international electron device conference, San Francisco, CA (USA), 10-12 Dec 1990
Country of Publication:
United States
Language:
English