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Accurate analysis of complex alpha-particle spectra using a PC

Conference · · Transactions of the American Nuclear Society; (United States)
OSTI ID:6454191
;  [1]
  1. Commission of the European Communities, Geel (Belgium)
The fitting model adopted for the analysis of alpha spectra from silicon detectors is the convolution of a Gaussian and a weighted sum of exponentials. Details of this analytical function were published previously. This model was used in measurements of the alpha emission probabilities (P[alpha]) of various actinides including [sup 237]Np, [sup 236]Pu, [sup 239]Pu, and [sup 243]Am. It also enables the analysis of spectra from mixed actinides, e.g., [sup 239/240]Pu and [sup 238]Pu/[sup 241]Am. In the case of the [sup 237]Np, the accuracy of the P[alpha] data for the major lines was improved by more than one order of magnitude.
OSTI ID:
6454191
Report Number(s):
CONF-920919--
Conference Information:
Journal Name: Transactions of the American Nuclear Society; (United States) Journal Volume: 65:1
Country of Publication:
United States
Language:
English