Influence of peak pressure and pulse duration on substructure development and threshold stress measurements in shock-loaded copper
Conference
·
OSTI ID:6453569
Based upon a study of the independent variation of peak pressure and pulse duration upon the shock loading response of OFE copper, the following conclusions can be drawn: (1) Increasing peak pressure or pulse duration was found to decrease the observed dislocation cell size and increase the yield strength and (2) the influence of pulse duration is attributed to the influence of reorganization time on the amount of dislocation generation during the rarefaction release.
- Research Organization:
- Los Alamos National Lab., NM (USA)
- DOE Contract Number:
- W-7405-ENG-36
- OSTI ID:
- 6453569
- Report Number(s):
- LA-UR-87-1479; CONF-8705109-1; ON: DE87010098
- Country of Publication:
- United States
- Language:
- English
Similar Records
Influence of loading rate on the mechanical response and substructure evolution of shock-loaded copper
Influence of peak pressure on the substructure evolution and mechanical properties of shock-loaded 6061-T6 aluminum
Effect of Shock Compression Method on the Defect Substructure in Monocrystalline Copper
Conference
·
Mon Dec 31 23:00:00 EST 1990
·
OSTI ID:5644121
Influence of peak pressure on the substructure evolution and mechanical properties of shock-loaded 6061-T6 aluminum
Conference
·
Wed Dec 31 23:00:00 EST 1986
·
OSTI ID:6230940
Effect of Shock Compression Method on the Defect Substructure in Monocrystalline Copper
Conference
·
Wed Feb 16 23:00:00 EST 2005
·
OSTI ID:15015859