The single-event-effect behavior of commercial-off-the-shelf memory devices -- A decade in low-earth orbit
- Univ. of Surrey, Guildford (United Kingdom). Centre for Satellite Engineering Research
This paper presents the results of a 10-year study on radiation effects in commercial-off-the-shelf (COTS) memory devices operating within the on-board data handling systems of five low-Earth orbiting microsatellites, designed and built at the University of Surrey (UoS). The ionizing particle environment inside three of these spacecraft has been investigated concurrently using radiation monitoring payloads developed by UoS and the Defence Evaluation and Research Agency (DERA). Through the use of these monitoring instruments, and an allied program of ground-based testing of the memory devices, the industry-standard computer models of the radiation environment have been verified, and the memory device behavior has been characterized with respect to single-event effects (SEEs) due to galactic cosmic-rays, geomagnetically trapped particles, and solar particles.
- OSTI ID:
- 644143
- Report Number(s):
- CONF-970934-; ISSN 0018-9499; TRN: 98:008076
- Journal Information:
- IEEE Transactions on Nuclear Science, Vol. 45, Issue 3Pt3; Conference: RADECS 97: radiations and their effects on devices and systems conference, Cannes (France), 15-19 Sep 1997; Other Information: PBD: Jun 1998
- Country of Publication:
- United States
- Language:
- English
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