Single-shot measurement of the intensity and phase of an arbitrary ultrashort pulse by using frequency-resolved optical gating

Journal Article · Sat May 15 04:00:00 EDT 1993 · Optics Letters; (United States)

DOI:https://doi.org/10.1364/OL.18.000823· OSTI ID:6440158

Kane, D J ^[1]; Trebino, R ^[2]

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1. Southwest Sciences, Inc., Suite E-11, 1570 Pacheco Street, Santa Fe, New Mexico 87501 (United States)
2. Combustion Research Facility, Sandia National Laboratories, Livermore, California 94551 (United States)

We introduce a new technique, frequency-resolved optical gating, for measuring the intensity [ital I]([ital t]) and the phase [phi]([ital t]) of an individual arbitrary ultrashort pulse. Using an instantaneous nonlinear-optical interaction of two variably delayed replicas of the pulse, frequency-resolved optical gating involves measuring the spectrum of the signal pulse versus relative delay. The resulting trace, a spectrogram, yields an intuitive full-information display of the pulse. Inversion of this trace to obtain the pulse intensity and phase is equivalent to the well-known two-dimensional phase-retrieval problem and thus yields essentially unambiguous results for [ital I]([ital t]) and [phi]([ital t]).

• OSTI ID: 6440158
• Journal Information: Optics Letters; (United States), Journal Name: Optics Letters; (United States) Journal Issue: 10 Vol. 18:10; ISSN 0146-9592; ISSN OPLEDP
• Country of Publication: United States
• Language: English

Related Subjects

440600* -- Optical Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
DESIGN
ELECTRONIC EQUIPMENT
EQUIPMENT
FREQUENCY MEASUREMENT
NONLINEAR OPTICS
OPTICS
PULSE ANALYZERS
RESOLUTION
TIME RESOLUTION
TIMING PROPERTIES