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Charge-exchange neutral-atom filling of ion diodes: Its effect on diode performance and A-K shorting

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.329045· OSTI ID:6439639

We present a model, supported by experimental evidence, showing how high-density charge-exchange neutral atoms (<10 keV) are created in a partially ionized anode plasma and flow into an ion-diode, anode-cathode (A-K) gap. The buildup of the neutral atoms in the A-K gap and their ionization can cause early A-K shorting which limits high-power and/or long-pulse, ion-diode operation. Ways to avoid the charge-exchange phenomena are mentioned. The ability to produce large-pulsed fluxes of energetic neutrals may have unique applications of its own. For example, high rep-rate spark gaps could benefit from the reduced gas load of an injected short pulse of high-density neutral atoms. Also discussed is the possibility of using an ion-diode geometry to fill a spark-gap cavity with neutrals and then initiate total volume breakdown by ion-impact ionization, thereby avoiding inductive electron filaments.

Research Organization:
Lawrence Livermore National Laboratory, Livermore, California 94550
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
6439639
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 52:4; ISSN JAPIA
Country of Publication:
United States
Language:
English