An Allan variance real-time processing system for frequency stability measurements of semiconductor lasers

Journal Article · Wed Aug 01 04:00:00 EDT 1990 · IEEE Transactions on Instrumentation and Measurement (Institute of Electrical and Electronics Engineers); (USA)

DOI:https://doi.org/10.1109/19.57247· OSTI ID:6426987

Kuboki, K; Ohtso, M ^[1]

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1. Tokyo Inst. of Technology, Graduate School at Nagatsuta, 4259 Nagatsuta, Midori-ku, Yokohama, Kanagawa 227 (JP)

This paper reports on a real-time frequency stability measurement system for semiconductor lasers. Since the frequency of the input signal is successively measured without clearing the counter, The Allan variance can be accurately measured by following its definition. Measurements of the Allan variance made with this system are more accurate than those made with conventional instruments. The Allan variance may be measured for integration times {tau} from 1 {mu}s to 10 000 s, and the number N of measured frequencies averaged over the integration time {tau} can be arbitrarily selected up to N equals 707 for each integration time. The highest measurable frequency was 90 MHz. It was demonstrated experimentally that this system can be used for measurements of the frequency stability of semiconductor lasers.

• OSTI ID: 6426987
• Journal Information: IEEE Transactions on Instrumentation and Measurement (Institute of Electrical and Electronics Engineers); (USA), Journal Name: IEEE Transactions on Instrumentation and Measurement (Institute of Electrical and Electronics Engineers); (USA) Vol. 39:4; ISSN IEIMA; ISSN 0018-9456
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
426002* -- Engineering-- Lasers & Masers-- (1990-)
99 GENERAL AND MISCELLANEOUS
990200 -- Mathematics & Computers
CONTROL
FREQUENCY CONTROL
LASERS
MEASURING INSTRUMENTS
PHASE STABILITY
REAL TIME SYSTEMS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR LASERS
SOLID STATE LASERS
STABILITY