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Title: Microstructural studies of epitaxial Ge films grown on (100) GaAs by laser photochemical vapor deposition

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.343352· OSTI ID:6406998

Ge films grown on (100) GaAs by laser photochemical vapor deposition (LPVD) in parallel geometry at temperatures (T/sub s/) ranging from /similar to/240 to 415 /sup 0/C have been examined by transmission electron microscopy. For 285 less than or equal toT/sub s/approx. <330 /sup 0/C, a thin (250--700 A) epitaxial film is grown initially but a switch to amorphous material is subsequently observed. At higher substrate temperatures (T/sub s/ approx. >400 /sup 0/C), thicker (approx. >800 A) epitaxial Ge films are grown before the transition to polycrystalline material takes place. In the absence of external 193-nm laser radiation (i.e., growing by conventional low-pressure chemical vapor deposition), the Ge films are completely amorphous (285 less than or equal toT/sub s/less than or equal to330 /sup 0/C) or heavily defected polycrystalline (T/sub s//similar to/400 /sup 0/C). The >100 /sup 0/C temperature reduction for the growth of epi Ge films made possible by LPVD is attributed to the direct production of a species (GeH/sub 3/) by the laser which is collisionally converted to Ge/sub 2/H/sub 6/ en route to the substrate. Upon reaching the (100) GaAs surface, the digermane is pyrolyzed. Experiments with (100) substrates tilted 3/sup 0/ toward (110) yielded thinner (/similar to/120 A), but smooth, epitaxial films which is attributed to the higher density of available nucleation sites. Films grown at 280--330 /sup 0/C on (111) oriented GaAs were completely amorphous which appears to arise from reduced adatom mobilities on (111) surfaces.

Research Organization:
University of Illinois, Urbana, Illinois 61801
OSTI ID:
6406998
Journal Information:
J. Appl. Phys.; (United States), Vol. 65:10
Country of Publication:
United States
Language:
English