Toward shorter wavelength lasers and soft X-ray laser microscopy

Journal Article · Sat Oct 01 04:00:00 EDT 1988 · IEEE Trans. Plasma Sci.; (United States)

DOI:https://doi.org/10.1109/27.8958· OSTI ID:6403841

Skinner, C H; Kim, D; Meixler, L; Nam, C H; Tighe, W ^[1]; Dicicco, D ^[2]; Suckewer, S ^[3]

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1. Plasma Physics Lab., Princeton Univ., Princeton, NJ (US)
2. Princeton X-ray Laser, Inc., and the Plasma Physics Lab., Princeton Univ., Princeton, NJ (US)
3. Mechanical Aerospace Engineering Dept. and the Plasma Physics Lab., Princeton Univ., Princeton, NJ (US)

The authors present two approaches to X-ray laser development at Princeton and review progress toward the wavelength region below 10 nm. In addition, they present the first results from the application of the existing soft X-ray laser at 18.2 nm to X-ray microscopy.

• OSTI ID: 6403841
• Journal Information: IEEE Trans. Plasma Sci.; (United States), Journal Name: IEEE Trans. Plasma Sci.; (United States) Vol. 16:5; ISSN ITPSB
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
420300* -- Engineering-- Lasers-- (-1989)
440300 -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
DESIGN
ELECTROMAGNETIC RADIATION
IONIZING RADIATIONS
LASERS
MICROSCOPY
RADIATIONS
SOFT X RADIATION
WAVELENGTHS
X RADIATION
X-RAY LASERS