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Pressure and lifetime behavior of NSLS storage rings

Technical Report ·
DOI:https://doi.org/10.2172/6396090· OSTI ID:6396090

Several contributions to the total beam lifetime in an electron storage ring are briefly discussed, including the transverse distribution of electrons in the bunch, the Touschek effect, beam-gas interactions, and various instabilities. Conditioning of the NSLS vuv and x-ray rings is described. The pressure-lifetime performance of the two rings are then presented. (LEW)

Research Organization:
Brookhaven National Lab., Upton, NY (USA)
DOE Contract Number:
AC02-76CH00016
OSTI ID:
6396090
Report Number(s):
BNL-37585; ON: DE86006875
Country of Publication:
United States
Language:
English