X-ray photoelectron spectroscopy investigation of the incorporation of surface oxides into bulk zirconium

Journal Article · Wed Jul 01 04:00:00 EDT 1987 · J. Vac. Sci. Technol., A; (United States)

DOI:https://doi.org/10.1116/1.574814· OSTI ID:6371105

West, P E; George, P M

X-ray photoelectron spectroscopy (XPS) and ion scattering spectroscopy have been used to investigate the mechanism by which a thin ZrO/sub 2/ film formed at the surface of polycrystalline zirconium dissolves into the bulk zirconium at 400/sup 0/C under nonoxidizing conditions. In addition to ZrO/sub 2/, a zirconium suboxide is directly observed in the XPS spectra taken after oxidation. On heating the oxidized Zr the intensity of both the Zr 3d/sub 5/2/ associated with ZrO/sub 2/ and the O 1s decay linearly with time. A concomitant linear increase is observed in the summed intensities of the Zr 3d/sub 5/2/ band associated with Zr metal and the suboxide Zr/sub x/O. A model is proposed to explain these observations which involves oxygen ion transport from the ZrO/sub 2/ to the metal interface where formation of a suboxide intermediate appears to be the rate-controlling step. The postulated suboxide at this temperature is Zr/sub x/O with x>1.

• Research Organization: Aerojet Electrosystems Co., Azusa, California 91702
• OSTI ID: 6371105
• Journal Information: J. Vac. Sci. Technol., A; (United States), Journal Name: J. Vac. Sci. Technol., A; (United States) Vol. 5:4; ISSN JVTAD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360105* -- Metals & Alloys-- Corrosion & Erosion
CHALCOGENIDES
CHARGED-PARTICLE TRANSPORT
CHEMICAL REACTIONS
DIFFUSION
ELECTROMAGNETIC RADIATION
ELECTRON SPECTROSCOPY
ELEMENTS
INTERFACES
IONIZING RADIATIONS
METALS
OXIDATION
OXIDES
OXYGEN COMPOUNDS
PHOTOELECTRON SPECTROSCOPY
RADIATION TRANSPORT
RADIATIONS
SOLUBILITY
SOLVENT PROPERTIES
SPECTROSCOPY
TRANSITION ELEMENT COMPOUNDS
TRANSITION ELEMENTS
X RADIATION
ZIRCONIUM
ZIRCONIUM COMPOUNDS
ZIRCONIUM OXIDES