Determination of the perpendicular penetration depth in superconducting thin films from the observation of nonuniform supercurrent flow

Journal Article · Wed Mar 01 04:00:00 EST 1989 · Phys. Rev. B: Condens. Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.39.4140· OSTI ID:6359838

Pyun, D S; Ulm, E R; Lemberger, T R

By observing the nonuniform supercurrent density in wide superconducting thin films with a tunneling technique, we determine the perpendicular penetration depth lambda/sub p/ of the film. lambda/sub p/ has the predicted dependence on normalized temperature T/T/sub c/ and on sheet resistance R/sub D'Alembertian/, but is a factor of 1.5 to 2 larger than expected theoretically, even when strong electron-phonon coupling is taken into account.

• Research Organization: Department of Physics, Ohio State University, Columbus, Ohio 43210
• OSTI ID: 6359838
• Journal Information: Phys. Rev. B: Condens. Matter; (United States), Journal Name: Phys. Rev. B: Condens. Matter; (United States) Vol. 39:7; ISSN PRBMD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
656100 -- Condensed Matter Physics-- Superconductivity
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
AMORPHOUS STATE
CHALCOGENIDES
CURRENTS
ELECTRIC CURRENTS
ELECTRON-PHONON COUPLING
ELEMENTS
FILMS
INDIUM
INDIUM COMPOUNDS
INDIUM OXIDES
JUNCTIONS
METALS
OXIDES
OXYGEN COMPOUNDS
PENETRATION DEPTH
SUPERCONDUCTING FILMS
SUPERCONDUCTING JUNCTIONS
TEMPERATURE DEPENDENCE
TUNNEL EFFECT