Biased probe for plasma diagnostics in spherical electrostatic inertial plasma confinement
Journal Article
·
· Review of Scientific Instruments; (USA)
- Fusion Studies Laboratory, Department of Nuclear Engineering, University of Illinois, Urbana, Illinois 61801 (USA)
The biased probe, as a unique extension of the Langmuir probe, offers several advantages in measuring the charged-particle flux versus position in a beam-dominated plasma such as encountered in the spherical electrostatic inertial confinement (SEIC) device. The probe operates in a non-Maxwellian and locally non-neutral plasma, where the Debye length is large compared to the probe itself. Its conical particle acceptance extension minimizes the measurement error caused by the distortion of the SEIC potential structures. Either the ion or electron flux can be measured using the proper bias on its inner collecting element.
- OSTI ID:
- 6351559
- Journal Information:
- Review of Scientific Instruments; (USA), Journal Name: Review of Scientific Instruments; (USA) Vol. 61:10; ISSN RSINA; ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
700102* -- Fusion Energy-- Plasma Research-- Diagnostics
CHARGED PARTICLES
CONFIGURATION
CONFINEMENT
DEBYE LENGTH
DIMENSIONS
ELECTRIC POTENTIAL
ELECTRIC PROBES
ELECTROSTATICS
FLUX DENSITY
INERTIAL CONFINEMENT
LANGMUIR PROBE
LENGTH
MODIFICATIONS
OPERATION
PLASMA CONFINEMENT
PLASMA DIAGNOSTICS
PROBES
SPHERICAL CONFIGURATION
700102* -- Fusion Energy-- Plasma Research-- Diagnostics
CHARGED PARTICLES
CONFIGURATION
CONFINEMENT
DEBYE LENGTH
DIMENSIONS
ELECTRIC POTENTIAL
ELECTRIC PROBES
ELECTROSTATICS
FLUX DENSITY
INERTIAL CONFINEMENT
LANGMUIR PROBE
LENGTH
MODIFICATIONS
OPERATION
PLASMA CONFINEMENT
PLASMA DIAGNOSTICS
PROBES
SPHERICAL CONFIGURATION