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Biased probe for plasma diagnostics in spherical electrostatic inertial plasma confinement

Journal Article · · Review of Scientific Instruments; (USA)
DOI:https://doi.org/10.1063/1.1141768· OSTI ID:6351559
;  [1]
  1. Fusion Studies Laboratory, Department of Nuclear Engineering, University of Illinois, Urbana, Illinois 61801 (USA)
The biased probe, as a unique extension of the Langmuir probe, offers several advantages in measuring the charged-particle flux versus position in a beam-dominated plasma such as encountered in the spherical electrostatic inertial confinement (SEIC) device. The probe operates in a non-Maxwellian and locally non-neutral plasma, where the Debye length is large compared to the probe itself. Its conical particle acceptance extension minimizes the measurement error caused by the distortion of the SEIC potential structures. Either the ion or electron flux can be measured using the proper bias on its inner collecting element.
OSTI ID:
6351559
Journal Information:
Review of Scientific Instruments; (USA), Journal Name: Review of Scientific Instruments; (USA) Vol. 61:10; ISSN RSINA; ISSN 0034-6748
Country of Publication:
United States
Language:
English