Mechanical properties of metallic films on sapphire

Conference · Tue Jan 01 00:00:00 EST 1985

OSTI ID:6346747

List, F A; McKee, R A

A knowledge of interfacial mechanical properties is of considerable importance to the areas of oxidation, corrosion, metallization, and composite materials. We have developed an experimental apparatus capable of simultaneous measurements of elastic and anelastic properties of materials in controlled atmospheres (10 W to 10U Pa) from 25 to 1000C. The apparatus employs the technique of dynamic resonance in which a material's mechanical resonance spectrum can be determined over a range 10S to 10V Hz with resolution +-0.001 Hz. This resolution has enabled us to determine the mechanical properties of films as thin as approximately 10 nm. We present resonance results for thin films (approx.100 nm) of nickel and gold on sapphire substrates. Results suggest that nickel films on sapphire are adherent, i.e., cyclic strain is continuous at the film-substrate interface, over a range of temperature about the film growth temperature; whereas gold films show nonadherent behavior at all temperatures studied.

• Research Organization: Oak Ridge National Lab., TN (USA)
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 6346747
• Report Number(s): CONF-851217-29; ON: DE86005159; TRN: 86-004060
• Resource Relation: Conference: Materials Research Society meeting, Boston, MA, USA, 2 Dec 1985
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
GOLD
ADHESION
NICKEL
ELASTICITY
DYNAMIC LOADS
INTERFACES
NONDESTRUCTIVE TESTING
RESONANCE
SAPPHIRE
SUBSTRATES
THIN FILMS
YOUNG MODULUS
ALUMINIUM COMPOUNDS
ALUMINIUM OXIDES
CHALCOGENIDES
CORUNDUM
ELEMENTS
FILMS
MATERIALS TESTING
MECHANICAL PROPERTIES
METALS
MINERALS
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
TENSILE PROPERTIES
TESTING
TRANSITION ELEMENTS
360103* - Metals & Alloys- Mechanical Properties