Time-resolved imaging of gas phase nanoparticle synthesis by laser ablation

Journal Article · Mon Jun 01 04:00:00 EDT 1998 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.121516· OSTI ID:634192

Geohegan, D B; Puretzky, A A; Duscher, G; Pennycook, S J ^[1]

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1. Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056 (United States)

The dynamics of nanoparticle formation, transport, and deposition by pulsed laser ablation of c-Si into 1{endash}10 Torr He and Ar gases are revealed by imaging laser-induced photoluminescence and Rayleigh-scattered light from gas-suspended 1{endash}10 nm SiO{sub x} particles. Two sets of dynamic phenomena are presented for times up to 15 s after KrF-laser ablation. Ablation of Si into heavier Ar results in a uniform, stationary plume of nanoparticles, while Si ablation into lighter He results in a turbulent ring of particles which propagates forward at 10 m/s. Nanoparticles unambiguously formed in the gas phase were collected on transmission electron microscope grids for Z-contrast imaging and electron energy loss spectroscopy analysis. The effects of gas flow on nanoparticle formation, photoluminescence, and collection are described. {copyright} {ital 1998 American Institute of Physics.}

• OSTI ID: 634192
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 23 Vol. 72; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
ABLATION
GASES
IMAGES
LASER RADIATION
PARTICULATES
PHOTOLUMINESCENCE
RAYLEIGH SCATTERING
SILICON COMPOUNDS
SYNTHESIS
TRANSMISSION ELECTRON MICROSCOPY