Fault-tolerance multiprocessor interconnection networks and their fault diagnosis
Thesis/Dissertation
·
OSTI ID:6341894
A new scheme to provide multistage interconnection networks with fault tolerance is introduced. Multiple paths between any input/output pair are created by connecting switching elements in the same stage together. Because the maximum number of possible alternative paths inherent in a network is exploited, the proposed fault-tolerant network possesses long mean lifetime and demonstrates high bandwidth. This scheme can be applied to notably enhance reliability and performance of any known multistage interconnection networks. To diagnose a fault in a redundant-path interconnection network is far more involved than a regular one. Based on a novel fault model, a diagnostic procedure is developed to effectively detect and locate any single fault existing in the multiple-path network. The fault model is practical and has potential usefulness as a tool for modeling faulty states of larger switching elements (e.g., n x n switching elements with n > 2). To facilitate this procedure, faults are classified into two groups in each of which the necessary test vectors are provided for correctly setting switching elements in the network under diagnosis when the procedure is conducted.
- Research Organization:
- Illinois Univ., Urbana (USA)
- OSTI ID:
- 6341894
- Country of Publication:
- United States
- Language:
- English
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