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Title: Depth profiling of oxidized a-C:D Layers on Be -- A comparison of {sup 4}He RBS and {sup 28}Si ERD analysis

Conference ·
OSTI ID:634156
;  [1]; ;  [2]
  1. EURATOM-Association, Garching (Germany). Max-Planck-Inst. fuer Plasmaphysik
  2. Sandia National Labs., Albuquerque, NM (United States)

In applications dealing with the deposition of amorphous hydrogenated carbon layers or in the determination of the composition of deposited layers on the walls of nuclear fusion plasma experiments, the analysis of mixtures of light elements on heavy substrates is necessary. Depth profiling by means of RBS is often difficult due to the overlap of the backscattering intensities of different constituents from different depths. The erosion and reaction of deposited amorphous deuterated carbon (a-C:D) films with a Be substrate due to annealing in air poses an analytical challenge especially if simultaneously the exchange of hydrogen isotopes should be monitored. The analysis of the different recoiling atoms from collisions with heavy ions in Elastic Recoil Detection (ERD) can provide a tool which resolves all constituents in a single analysis. In the present study the composition of intermixed layers on Be containing H, D, Be, C and O has been analyzed using conventional {sup 4}He RBS at 2.2 MeV together with 2.5 MeV {sup 4}He ERD for hydrogen isotope analysis. At these energies, an overlap of signals from different constituents could be avoided in most cases. As alternative method heavy ion ERD using Si{sup 7+} ions extracted from a 5 MeV Tandem Van de Graff accelerator was investigated. At a scattering angle of 30{degree} Si ions could not be scattered into the detector and a solid state detector without protecting foil could be used. Even in the intermixed layers at terminal energies of 5 MeV the heavy constituents could be separated while signals from recoiling hydrogen and deuterium atoms could be resolved on top of the signal from the Be substrate. For the analysis of the RBS and ERD data the newly developed spectra simulation program SIMNRA has been used which includes a large data bank for scattering and nuclear reaction cross sections. The depth profiles of all constituents extracted from the simulation are compared for both methods.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
634156
Report Number(s):
SAND-97-2141C; CONF-970785-; ON: DE98000182; TRN: 98:009486
Resource Relation:
Conference: 13. international conference on ion beam analysis (IBA-13), Lisbon (Portugal), 27 Jul - 1 Aug 1997; Other Information: PBD: Jun 1997
Country of Publication:
United States
Language:
English