Measuring emittance using beam position monitors

Conference · Fri Jan 01 00:00:00 EST 1993

DOI:https://doi.org/10.1109/PAC.1993.309381· OSTI ID:6338199

Russell, S; Carlsten, B

The Los Alamos Advanced Free Electron Laser uses a high charge (greater than InC), low emittance (normalized rams emittance less than 5[pi] mm mrad) photoinjector driven accelerator. The high brightness achieved is due, in large part, to the rapid acceleration of the electrons to relativistic velocities. As a result, the beam does not have time to thermalize its distribution and its universe profile is, in general, non-Gaussian. This, coupled with the very high brightness, makes it difficult to measure the transverse emittance. Techniques used must be able to withstand the rigors of very intense electron beams, and not be reliant on Gaussian assumptions. Beam position monitors are ideal for this. They are not susceptible to beam damage, and it has been shown previously that they can be used to measure the transverse emittance of a beam with a Gaussian profile. However, this Gaussian restriction is not necessary and, in fact, a transverse emittance measurement using beam position monitors is independent of the beam's distribution.

• Research Organization: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
• Sponsoring Organization: USDOE; USDOE, Washington, DC (United States)
• DOE Contract Number: W-7405-ENG-36
• OSTI ID: 6338199
• Report Number(s): LA-UR-93-1880; CONF-930511-48; ON: DE93014470
• Resource Relation: Conference: International particle accelerator conference, Washington, DC (United States), 17-20 May 1993
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
42 ENGINEERING
ELECTRON BEAMS
BEAM EMITTANCE
FREE ELECTRON LASERS
BEAM MONITORS
BEAM POSITION
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BEAMS
LASERS
LEPTON BEAMS
MEASURING INSTRUMENTS
MONITORS
PARTICLE BEAMS
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