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Selectivity loss during tungsten chemical vapor deposition: The role of tungsten pentafluoride

Journal Article · · J. Vac. Sci. Technol., A; (United States)
DOI:https://doi.org/10.1116/1.575854· OSTI ID:6335183
Our previous studies found evidence for a selectivity loss mechanism that is initiated by desorption of tungsten subfluorides formed by the reaction of WF/sub 6/ with metallic tungsten surfaces. When a hot (approx. =600 /sup 0/C) tungsten surface is exposed to WF/sub 6/, a nonvolatile subfluoride, apparently WF/sub 4/ , will accumulate on a nearby SiO/sub 2/ surface held at approx. =30 /sup 0/C. Disproportionation of this tungsten subfluoride upon heating above 350 /sup 0/C produces a reactive state of tungsten that induces rapid selectivity loss when exposed to chemical vapor deposition conditions. The net effect of this tungsten subfluoride desorption--disproportionation mechanism is the transport of tungsten from a tungsten surface to the silicon dioxide surface. Isolation of a higher tungsten subfluoride, apparently WF/sub 5/, has been accomplished by cooling the SiO/sub 2/ surface to approx. =-45 /sup 0/C under otherwise similar experimental conditions. Preliminary Auger spectroscopic results yield a stochiometry of F/W = 4.9 +- 0.5 for this subfluoride, and temperature programmed desorption results are consistent with the behavior of tungsten pentafluoride. Upon heating WF/sub 5/ multilayers, most of the compound desorbs, but some reaction and disproportionation occurs leaving a reduced state of tungsten on the SiO/sub 2/ surface. It seems likely that tungsten pentafluoride is the key volatile species in a tungsten transport mechanism that can initiate selectivity loss.
Research Organization:
Sandia National Laboratories, Albuquerque, New Mexico 87185
OSTI ID:
6335183
Journal Information:
J. Vac. Sci. Technol., A; (United States), Journal Name: J. Vac. Sci. Technol., A; (United States) Vol. 7:3; ISSN JVTAD
Country of Publication:
United States
Language:
English