Optical and electrical properties of single-crystalline zirconium carbide

Journal Article · Sun Dec 15 04:00:00 EST 1985 · Phys. Rev. B: Condens. Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.32.7743· OSTI ID:6323073

Modine, F A; Haywood, T W; Allison, C Y

Optical and electrical properties are reported for single-crystalline ZrC/sub 0.89/. The specular reflectance was measured between 0.025 and 6.5 eV, and ellipsometry measurements were made between 1.2 and 4.5 eV. The combination of ellipsometry with reflectance allows optical functions to be computed reliably between 0 and 6.5 eV and also provides a check on the consistency of the measurements. The van der Pauw technique was used to measure the electrical resistivity of the samples at temperatures between 4.2 and 300 K and the Hall coefficient at room temperature. Drude parameters obtained from the electrical measurements are in good agreement with those obtained from the optical data. Both the optical and electrical results are compared to other experimental results and to theory.

• Research Organization: Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 6323073
• Journal Information: Phys. Rev. B: Condens. Matter; (United States), Journal Name: Phys. Rev. B: Condens. Matter; (United States) Vol. 32:12; ISSN PRBMD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
CARBIDES
CARBON COMPOUNDS
CRYSTALS
DATA
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELLIPSOMETRY
ENERGY RANGE
EV RANGE
EXPERIMENTAL DATA
HALL EFFECT
INFORMATION
LOW TEMPERATURE
MEASURING METHODS
MEDIUM TEMPERATURE
MONOCRYSTALS
NUMERICAL DATA
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
REFLECTIVITY
SURFACE PROPERTIES
TRANSITION ELEMENT COMPOUNDS
ULTRALOW TEMPERATURE
VERY LOW TEMPERATURE
ZIRCONIUM CARBIDES
ZIRCONIUM COMPOUNDS