Interactive simulation of high resolution electron micrographs
Conference
·
OSTI ID:6314301
Recent advances in computer hardware now allows image simulation of high resolution transmission electron microscope images to be carried out in a matter of minutes with outputs on high resolution video monitors. These ''near real time'' calculations have produced an emphasis on interactive software that allows changes to both the atomic model and microscope parameters. This has resulted in a set of programs being written at the National Center for Electron Microscopy (NCEM). These programs are described and the factors receiving the most attention are listed. This attention to user interface, flexibility, expansion possibilities, and accuracy make these programs the most powerful and user friendly of their kind. (FI)
- Research Organization:
- Lawrence Berkeley Lab., CA (USA)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 6314301
- Report Number(s):
- LBL-23173; CONF-870862-7; ON: DE87010255
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
42 ENGINEERING
420200 -- Engineering-- Facilities
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& Techniques
656000 -- Condensed Matter Physics
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
99 GENERAL AND MISCELLANEOUS
990220* -- Computers
Computerized Models
& Computer Programs-- (1987-1989)
ACCURACY
COMPUTERIZED SIMULATION
DISPLAY DEVICES
ELECTRON MICROSCOPY
EXPANSION
FLEXIBILITY
IMAGE PROCESSING
IMAGES
INTERACTIVE DISPLAY DEVICES
INTERFACES
MAN-MACHINE SYSTEMS
MECHANICAL PROPERTIES
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PROCESSING
PROGRAMMING
RESOLUTION
SIMULATION
TENSILE PROPERTIES
TRANSMISSION ELECTRON MICROSCOPY
420200 -- Engineering-- Facilities
Equipment
& Techniques
656000 -- Condensed Matter Physics
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
99 GENERAL AND MISCELLANEOUS
990220* -- Computers
Computerized Models
& Computer Programs-- (1987-1989)
ACCURACY
COMPUTERIZED SIMULATION
DISPLAY DEVICES
ELECTRON MICROSCOPY
EXPANSION
FLEXIBILITY
IMAGE PROCESSING
IMAGES
INTERACTIVE DISPLAY DEVICES
INTERFACES
MAN-MACHINE SYSTEMS
MECHANICAL PROPERTIES
MICROSCOPY
PROCESSING
PROGRAMMING
RESOLUTION
SIMULATION
TENSILE PROPERTIES
TRANSMISSION ELECTRON MICROSCOPY