Spatial resolution of microwave/millimeter-wave reflectometry
Journal Article
·
· Review of Scientific Instruments; (USA)
- Institute of Plasma and Fusion Research, Electrical Engineering Department, University of California, Los Angeles, CA (USA)
Reflectometry is currently being used to investigate density fluctuations and turbulence in tokamak plasmas. However, there are unresolved questions about the spatial resolution and wave number sensitivity of this diagnostic method which impact the interpretation of the data. These questions are currently being addressed in a cylindrical, pulsed filament discharge plasma where ion acoustic waves (10--100 kHz) are launched toward the incident microwaves. Preliminary data supporting the spatially localized nature of reflectometry are presented. A computational model is also being developed to provide quantitative comparisons with experiment.
- DOE Contract Number:
- FG03-86ER53225
- OSTI ID:
- 6308796
- Journal Information:
- Review of Scientific Instruments; (USA), Journal Name: Review of Scientific Instruments; (USA) Vol. 61:10; ISSN RSINA; ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
700102* -- Fusion Energy-- Plasma Research-- Diagnostics
ELECTRIC PROBES
ELECTROMAGNETIC RADIATION
EQUIPMENT
FAR INFRARED RADIATION
INFRARED RADIATION
ION ACOUSTIC WAVES
ION WAVES
LANGMUIR PROBE
LIGHT SCATTERING
MICROWAVE RADIATION
OPTICAL EQUIPMENT
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
PLASMA DENSITY
PLASMA DIAGNOSTICS
PLASMA WAVES
PROBES
RADIATIONS
REFLECTIVITY
RESOLUTION
SCATTERING
SURFACE PROPERTIES
700102* -- Fusion Energy-- Plasma Research-- Diagnostics
ELECTRIC PROBES
ELECTROMAGNETIC RADIATION
EQUIPMENT
FAR INFRARED RADIATION
INFRARED RADIATION
ION ACOUSTIC WAVES
ION WAVES
LANGMUIR PROBE
LIGHT SCATTERING
MICROWAVE RADIATION
OPTICAL EQUIPMENT
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
PLASMA DENSITY
PLASMA DIAGNOSTICS
PLASMA WAVES
PROBES
RADIATIONS
REFLECTIVITY
RESOLUTION
SCATTERING
SURFACE PROPERTIES