Observation of a correlation length finite-size effect in Rayleigh scattering from thin critical fluid films

Journal Article · Mon Feb 03 00:00:00 EST 1986 · Phys. Rev. Lett.; (United States)

DOI:https://doi.org/10.1103/PhysRevLett.56.480· OSTI ID:6302888

Tang, Y; Beale, P D; Mockler, R C; O'Sullivan, W J

Rayleigh linewidth data gathered at small scattering angles on critical-mixture films of thickness 2L are found to collapse about a single universal curve, GAMMA((Kxi/sup eff/), where GAMMA((x) is the 3D reduced Rayleigh linewidth function, and xi/sup eff/ is an effective correlation length obeying a general finite-size scaling relation, xi/sup eff//L = F(xi/L). The latter reveals that xi/sup eff/ grows with xi until xiroughly-equalL, when its growth terminates, implying the existence of surface layers of thickness xi formed by preferential wall-fluid interactions.

• Research Organization: Department of Physics, University of Colorado, Boulder, Colorado 80309
• DOE Contract Number: AC02-82ER13004
• OSTI ID: 6302888
• Journal Information: Phys. Rev. Lett.; (United States), Vol. 56:5
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
HYDROCARBONS
LIGHT SCATTERING
PARTICLE SIZE
WATER
BINARY MIXTURES
BOUNDARY LAYERS
CHEMICAL COMPOSITION
CONTAINERS
FLUIDS
LINE WIDTHS
RAYLEIGH SCATTERING
SILICA
SMALL ANGLE SCATTERING
TEMPERATURE DEPENDENCE
THIN FILMS
CHALCOGENIDES
COHERENT SCATTERING
DISPERSIONS
FILMS
HYDROGEN COMPOUNDS
LAYERS
MINERALS
MIXTURES
ORGANIC COMPOUNDS
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
SCATTERING
SILICON COMPOUNDS
SILICON OXIDES
SIZE
360602* - Other Materials- Structure & Phase Studies