In situ x-ray reflectivity and diffraction studies of the Au(001) reconstruction in an electrochemical cell

Journal Article · Mon Sep 17 04:00:00 EDT 1990 · Physical Review Letters; (USA)

DOI:https://doi.org/10.1103/PhysRevLett.65.1466· OSTI ID:6292467

Ocko, B M; Wang, J ^[1]; Davenport, A; Isaacs, H ^[2]

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1. Physics Department, Brookhaven National Laboratory, Upton, NY (USA)
2. Department of Applied Science, Brookhaven National Laboratory, Upton, NY (USA)

{ital In} {ital situ} x-ray specular reflectivity and glancing-incidence-angle x-ray-diffraction measurements have been performed at the Au(001) surface in a 0.01{ital M} HClO{sub 4} solution under potential control in an electrochemical cell. At {minus}0.4 V versus an Ag/AgCl electrode, the gold surface exhibits a hexagonal reconstructed layer with a mass density 21% greater than the underlying bulk layers. The reconstruction disappears above 0.5 V, and the excess atoms form a new atomic layer with a density corresponding to 22% of a bulk layer. The reconstruction fully recovers below {minus}0.3 V.

• DOE Contract Number: AC02-76CH00016
• OSTI ID: 6292467
• Journal Information: Physical Review Letters; (USA), Journal Name: Physical Review Letters; (USA) Vol. 65:12; ISSN PRLTA; ISSN 0031-9007
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360101 -- Metals & Alloys-- Preparation & Fabrication
360102* -- Metals & Alloys-- Structure & Phase Studies
CHLORATES
CHLORIDES
CHLORINE COMPOUNDS
COHERENT SCATTERING
CRYSTAL STRUCTURE
DATA
DIFFRACTION
DISPERSIONS
ELECTROCHEMICAL CELLS
ELECTRODES
ELEMENTS
EXPERIMENTAL DATA
GOLD
HALIDES
HALOGEN COMPOUNDS
HYDROGEN COMPOUNDS
IN-SITU PROCESSING
INCIDENCE ANGLE
INFORMATION
METALS
MIXTURES
NUMERICAL DATA
OPTICAL PROPERTIES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
PROCESSING
REFLECTIVITY
SCATTERING
SILVER
SILVER CHLORIDES
SILVER COMPOUNDS
SOLUTIONS
SURFACE PROPERTIES
TRANSITION ELEMENT COMPOUNDS
TRANSITION ELEMENTS
X-RAY DIFFRACTION