Ultrasonic microscope system
Patent
·
OSTI ID:6265375
An ultrasonic transmitter-receiver for radiating a focused ultrasonic beam and a sample are moved relative to each other in the axial direction of the ultrasonic beam. A reflected wave from the sample is received and a curve V(Z) of variations in the level of the reflected wave with respect to the relative movement is obtained. A reference level of interference of a directly reflected wave and a leaky elastic wave is subtracted from V(Z) to perform waveform processing. The waveform processing output is subjected to a waveform analysis, and from the analysis results, the velocity and/or the attenuation of the leaky elastic wave are calculated.
- Assignee:
- EDB-86-043752
- Patent Number(s):
- US 4541281
- OSTI ID:
- 6265375
- Country of Publication:
- United States
- Language:
- English
Similar Records
Estimates of formation sound speed from ultrasonic reflections
Nondestructive testing of coatings using ultrasonic leaky Rayleigh waves
IMPROVEMENTS IN OR RELATING TO ULTRASONIC METHODS OF TESTING
Journal Article
·
Thu Jun 01 00:00:00 EDT 1995
· SPE Formation Evaluation
·
OSTI ID:64471
Nondestructive testing of coatings using ultrasonic leaky Rayleigh waves
Conference
·
Fri Dec 30 23:00:00 EST 1994
·
OSTI ID:160532
IMPROVEMENTS IN OR RELATING TO ULTRASONIC METHODS OF TESTING
Patent
·
Wed Jul 10 00:00:00 EDT 1963
·
OSTI ID:4671766
Related Subjects
440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
ACOUSTIC DETECTION
ACOUSTIC MEASUREMENTS
ACOUSTIC TESTING
CHARGED PARTICLE DETECTION
COMPUTERS
DESIGN
DETECTION
ELASTICITY
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
EQUIPMENT
FOCUSING
FUNCTION GENERATORS
GATING CIRCUITS
IMAGE PROCESSING
MATERIALS TESTING
MEASURING METHODS
MECHANICAL PROPERTIES
MEMORY DEVICES
MICROSCOPES
MICROSCOPY
NONDESTRUCTIVE TESTING
PROCESSING
PULSE GENERATORS
RADIATION DETECTION
REFLECTION
SOUND WAVES
TENSILE PROPERTIES
TESTING
ULTRASONIC TESTING
ULTRASONIC WAVES
VELOCITY
WAVE FORMS
WAVE PROPAGATION
47 OTHER INSTRUMENTATION
ACOUSTIC DETECTION
ACOUSTIC MEASUREMENTS
ACOUSTIC TESTING
CHARGED PARTICLE DETECTION
COMPUTERS
DESIGN
DETECTION
ELASTICITY
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
EQUIPMENT
FOCUSING
FUNCTION GENERATORS
GATING CIRCUITS
IMAGE PROCESSING
MATERIALS TESTING
MEASURING METHODS
MECHANICAL PROPERTIES
MEMORY DEVICES
MICROSCOPES
MICROSCOPY
NONDESTRUCTIVE TESTING
PROCESSING
PULSE GENERATORS
RADIATION DETECTION
REFLECTION
SOUND WAVES
TENSILE PROPERTIES
TESTING
ULTRASONIC TESTING
ULTRASONIC WAVES
VELOCITY
WAVE FORMS
WAVE PROPAGATION