Noise reduction in negative-ion quadrupole mass spectrometry
Patent
·
OSTI ID:6260685
A quadrupole mass spectrometer (QMS) system is described having an ion source, quadrupole mass filter, and ion collector/recorder system. A weak, transverse magnetic field and an electron collector are disposed between the quadrupole and ion collector. When operated in negative ion mode, the ion source produces a beam of primarily negatively-charged particles from a sample, including electrons as well as ions. The beam passes through the quadrupole and enters the magnetic field, where the electrons are deflected away from the beam path to the electron collector. The negative ions pass undeflected to the ion collector where they are detected and recorded as a mass spectrum.
- DOE Contract Number:
- AC09-89SR18035
- Assignee:
- IMS; EDB-93-121420
- Patent Number(s):
- US 5204530; A
- Application Number:
- PPN: US 7-813730
- OSTI ID:
- 6260685
- Country of Publication:
- United States
- Language:
- English
Similar Records
Noise reduction in negative-ion quadrupole mass spectrometry
Mass spectrometer
Design of an electrostatic magnetic quadrupole accelerator
Patent
·
Thu Dec 31 23:00:00 EST 1992
·
OSTI ID:868753
Mass spectrometer
Patent
·
Mon Oct 29 23:00:00 EST 1984
·
OSTI ID:5698425
Design of an electrostatic magnetic quadrupole accelerator
Journal Article
·
Sun Jan 31 23:00:00 EST 1993
· Review of Scientific Instruments; (United States)
·
OSTI ID:5523980
Related Subjects
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400102* -- Chemical & Spectral Procedures
440800 -- Miscellaneous Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
CHARGED PARTICLES
DESIGN
ELECTRONS
ELEMENTARY PARTICLES
FERMIONS
FILTERS
ION SOURCES
IONS
LEPTONS
MAGNETIC FIELDS
MASS SPECTRA
MASS SPECTROMETERS
MASS SPECTROSCOPY
MATERIALS
MEASURING INSTRUMENTS
MULTIPOLES
OPERATION
PARTICLE PRODUCTION
QUADRUPOLES
SPECTRA
SPECTROMETERS
SPECTROSCOPY
400102* -- Chemical & Spectral Procedures
440800 -- Miscellaneous Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
CHARGED PARTICLES
DESIGN
ELECTRONS
ELEMENTARY PARTICLES
FERMIONS
FILTERS
ION SOURCES
IONS
LEPTONS
MAGNETIC FIELDS
MASS SPECTRA
MASS SPECTROMETERS
MASS SPECTROSCOPY
MATERIALS
MEASURING INSTRUMENTS
MULTIPOLES
OPERATION
PARTICLE PRODUCTION
QUADRUPOLES
SPECTRA
SPECTROMETERS
SPECTROSCOPY