Crystallization and properties of a Si-Y-Al-O-N glass-ceramic

Journal Article · Sun Aug 01 00:00:00 EDT 1993 · Journal of the American Ceramic Society; (United States)

DOI:https://doi.org/10.1111/j.1151-2916.1993.tb08340.x· OSTI ID:6255143

Besson, J; Billieres, D; Rouxel, T ^[1]; Goursat, P ^[2]; Flynn, R; Hampshire, S ^[3]

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1. CNRS, Limoges (France). Lab. des Materiaux Ceramiques
2. CNRS, Limoges (France). Lab. des Ceramiques Nouvelles
3. Univ. of Limerick (Ireland). Materials Research Centre

Glasses have been prepared in the Si-Y-Al-O-N system by melting mixtures of silica, alumina, yttria, and silicon nitride. One particular glass containing 17 equiv% N has been investigated to observe the crystallization at temperatures in the range 1,050--1,300 C. The major crystalline phase observed is Y[sub 2]Si[sub 2]O[sub 7], existing as the [alpha] form below 1,200 C and the [beta] form above this temperature. Properties of the glass-ceramic, including thermal expansion coefficient, hardness, electrical resistivity, and creep have been assessed.

• OSTI ID: 6255143
• Journal Information: Journal of the American Ceramic Society; (United States), Vol. 76:8; ISSN 0002-7820
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ALUMINIUM OXIDES
CRYSTALLIZATION
MECHANICAL PROPERTIES
PHYSICAL PROPERTIES
SILICON NITRIDES
SILICON OXIDES
YTTRIUM OXIDES
CERAMICS
CREEP
CRYSTAL-PHASE TRANSFORMATIONS
ELECTRIC CONDUCTIVITY
EXPERIMENTAL DATA
GLASS
HARDNESS
MELTING
MICROSTRUCTURE
TEMPERATURE RANGE 1000-4000 K
THERMAL EXPANSION
X-RAY DIFFRACTION
ALUMINIUM COMPOUNDS
CHALCOGENIDES
COHERENT SCATTERING
DATA
DIFFRACTION
ELECTRICAL PROPERTIES
EXPANSION
INFORMATION
NITRIDES
NITROGEN COMPOUNDS
NUMERICAL DATA
OXIDES
OXYGEN COMPOUNDS
PHASE TRANSFORMATIONS
PNICTIDES
SCATTERING
SILICON COMPOUNDS
TEMPERATURE RANGE
TRANSITION ELEMENT COMPOUNDS
YTTRIUM COMPOUNDS
360200* - Ceramics
Cermets
& Refractories