Spin-flop tendencies in exchange-biased Co/CoO thin films
- National Institute of Standards and Technology, Gaithersburg, Maryland20899 (United States)
- Argonne National Laboratory, Argonne, Illinois60439 (United States)
- Center for Magnetic Recording Research, University of California at San Diego, La Jolla, California94720 (United States)
In order to study the antiferromagnetic (AFM) spin structure near the interface of exchange-biased bilayers, polarized neutron diffraction measurements were performed on a series of (111)Co(7.5 nm)/CoO (X nm) and CoO (X nm) thin films where X=20, 40, and 100 nm. In these samples, field cooling through the N{acute e}el temperature of the AFM increases the component of the CoO moment perpendicular to the applied field, relative to the parallel component. The subsequent application of a 500 Oe field perpendicular to the cooling direction rotates both the Co and CoO moments. Experiments on CoO films without Co showed a smaller difference between the parallel and perpendicular CoO moments in response to cooling and applied fields. Exchange coupling between the Co and CoO layers is apparently responsible for the increased projection of the AFM moments perpendicular to the cooling field. {copyright} {ital 1998 American Institute of Physics.}
- OSTI ID:
- 624872
- Report Number(s):
- CONF-980102--
- Journal Information:
- Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 11 Vol. 83; ISSN JAPIAU; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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