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Time-resolved measurements of short-wavelength fluorescence from x-ray-excited ions

Journal Article · · Opt. Lett.; (United States)
DOI:https://doi.org/10.1364/OL.12.000663· OSTI ID:6237515

We demonstrate a novel technique for time-resolved spectroscopic studies of highly excited ions. The technique uses a laser-produced plasma as a short-pulse, soft-x-ray light source with a high repetition rate. A Nd:YAG laser with a pulse duration of 90 psec, a pulse energy of 70..mu..J, and repetition rate of 10/sup 4/ pulses per second is focused onto a rotating metal target. Soft x rays from the resulting plasma photoionize a gas surrounding the target, and fluorescence from the gas is detected by using a spectrometer and a high-speed photodetector. Using the technique of time-correlated photon counting, we determined the radiative lifetime and collisional quenching rate of the Xe III 5s/sup 0/5p/sup 6/ /sup 1/S/sub 0/ state by observing its fluorescence at 108.9 nm. A time resolution of better than 400 psec was obtained. We also measured relative Auger decay yields of a core hole state in xenon using a higher-energy laser-produced plasma light source at a lower repetition rate.

Research Organization:
Department of Physics, University of California, Berkeley, Berkeley, California 94720
OSTI ID:
6237515
Journal Information:
Opt. Lett.; (United States), Journal Name: Opt. Lett.; (United States) Vol. 12:9; ISSN OPLED
Country of Publication:
United States
Language:
English