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Title: Two-electron excitation in slow ion-atom collisions: Excitation mechanisms and interferences among autoionizing states

Conference ·
OSTI ID:6234019
 [1]
  1. Argonne National Lab., IL (USA) Rice Univ., Houston, TX (USA). Dept. of Physics

The two-electron capture or excitation process resulting from collisions of H{sup +} and O{sup 6+} ions with He atoms in the energy range from 0.5 keV/amu to 5 keV/amu is studied within a molecular representation. The collision dynamics for formation of doubly excited O{sup 4+} ions and He** atoms and their (n{ell}, n{prime}{ell}{prime}) populations are analyzed in conjunction with electron correlations. Autoionizing states thus formed decay through the Auger process. An experimental study of an ejected electron energy spectrum shows ample structures in addition to two characteristic peaks that are identified by atomic and molecular autoionizations. These structures are attributable to various interferences among electronic states and trajectories. We examine the dominant sources of the interferences. 12 refs., 5 figs.

Research Organization:
Argonne National Lab., IL (USA)
Sponsoring Organization:
DOE/ER
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
6234019
Report Number(s):
CONF-9009294-1; ON: DE91004474; TRN: 90-036208
Resource Relation:
Conference: 15. international symposium on the physics of ionized gases (SPIG '90), Dubrovnik (Yugoslavia), 3-7 Sep 1990
Country of Publication:
United States
Language:
English