Preparation and characterization of Langmuir and Langmuir Blodgett films
Although monolayer Langmuir films at the air/water interface and multilayer Langmuir-Blodgett films deposited on various substrates have a time honored history, it is only recently that significant progress has been made in characterizing their structure. They will report on recent conventional and synchrotron x-ray studies, both at Northwestern University and elsewhere, on Langmuir and Langmuir Blodgett films. In particular the first in plane Langmuir Blodgett and monolayer Langmuir diffraction data have been obtained. Other experiments involving the elastic, and visco elastic response of Langmuir films, and the growth characteristics of Langmuir Blodgett multilayer films will also be discussed.
- Research Organization:
- Northwestern Univ., Evanston, IL
- DOE Contract Number:
- FG02-84ER45125
- OSTI ID:
- 6233300
- Journal Information:
- Appl. Phys. Commun.; (United States), Journal Name: Appl. Phys. Commun.; (United States) Vol. 7:1-2; ISSN APCOD
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BREMSSTRAHLUNG
COHERENT SCATTERING
CRYSTAL GROWTH
CRYSTAL STRUCTURE
DATA
DIFFRACTION
ELASTICITY
ELECTROMAGNETIC RADIATION
EXPERIMENTAL DATA
FILMS
INFORMATION
INTERFACES
IONIZING RADIATIONS
LAYERS
MECHANICAL PROPERTIES
NUMERICAL DATA
RADIATIONS
SCATTERING
SUBSTRATES
SYNCHROTRON RADIATION
TENSILE PROPERTIES
X RADIATION
X-RAY DIFFRACTION