Long-term stability of a Mo/Si multilayer structure

Journal Article · Wed Sep 01 00:00:00 EDT 1993 · Applied Optics; (United States)

DOI:https://doi.org/10.1364/AO.32.004852· OSTI ID:6227758

Barbee, Jr, T W ^[1]; Rife, J C; Kowalski, M P; Cruddace, R G; Seely, J F ^[2]; Hunter, W R ^[3]

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1. Lawrence Livermore National Laboratory, Livermore, California 94550 (United States)
2. Naval Research Laboratory, Washington, D.C. 20375 (United States)
3. SFA Inc., 1401 McCormick Drive, Landover, Maryland 20785 (United States)

The normal-incidence reflectance of a Mo/Si multilayer mirror, with peak reflectance near 130 A, was measured over a period of 20 months by using synchrotron radiation. The measured reflectances were unchanged over this period of time, and this indicates that the material layers and interfaces were stable.

• DOE Contract Number: AC02-76CH00016; W-7405-ENG-48
• OSTI ID: 6227758
• Journal Information: Applied Optics; (United States), Vol. 32:25; ISSN 0003-6935
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
MIRRORS
PHYSICAL RADIATION EFFECTS
MOLYBDENUM
SILICON
LAYERS
REFLECTION
REFLECTIVITY
STABILITY
X RADIATION
ELECTROMAGNETIC RADIATION
ELEMENTS
IONIZING RADIATIONS
METALS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
RADIATION EFFECTS
RADIATIONS
SEMIMETALS
SURFACE PROPERTIES
TRANSITION ELEMENTS
440200* - Radiation Effects on Instrument Components
Instruments
or Electronic Systems