Noninvasive in-process thickness measurement of an organic layer on steel using x-ray scattering

Conference · Wed Jan 01 04:00:00 EST 1992 · Transactions of the American Nuclear Society; (United States)

OSTI ID:6224796

Moskowitz, J

The motivation for this work was the need for a non-contacting composition-independent in-process technique for rapidly measuring the mass per unit area ([open quotes]surface density[close quotes]) of a continuous slab of organic material prepared on a stainless steel base. It was essential that the technique be adaptable to eventual implementation for on-line process control.

• OSTI ID: 6224796
• Report Number(s): CONF-920919--
• Conference Information: Journal Name: Transactions of the American Nuclear Society; (United States) Journal Volume: 65:1
• Country of Publication: United States
• Language: English

Related Subjects

07 ISOTOPE AND RADIATION SOURCES
070204* -- Radiation Sources-- Industrial Uses
Radiometric
440101 -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHEMICAL ANALYSIS
DATA COVARIANCES
DEPOSITION
ELEMENTS
MEASURING INSTRUMENTS
METALS
NONDESTRUCTIVE ANALYSIS
ON-LINE MEASUREMENT SYSTEMS
ON-LINE SYSTEMS
ORGANIC COMPOUNDS
RELIABILITY
SURFACE COATING
THICKNESS GAGES