Images of interlayer Josephson vortices in Tl{sub 2}Ba{sub 2}CuO{sub 6+{gamma}}

Journal Article · Fri Feb 20 04:00:00 EST 1998 · Science

DOI:https://doi.org/10.1126/science.279.5354.1193· OSTI ID:621730

Moler, K A ^[1]; Kirtley, J R ^[2]; Hinks, D G ^[3]

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1. Princeton Univ., NJ (United States)
2. IBM T.J. Watson Research Center, Yorktown Heights, NY (United States)
3. Argonne National Lab., IL (United States); and others

The strength of the interlayer Josephson tunneling in layered superconductors is an essential test of the interlayer tunneling model as a mechanism for superconductivity, as well as a useful phenomenological parameter. A scanning superconducting quantum interface device (SQUID) microscope was used to image interlayer Josephson vortices in Tl{sub 2}Ba{sub 2}CuO{sub 6+{gamma}} and to obtain a direct measure of the interlayer tunneling in a high-transition temperature superconductor with a single copper oxide plane per unit cell. The measured interlayer penetration depth, {lambda}{sub c}, is {approx} 20 micrometers, about 20 times the penetration depth required by the interlayer tunneling model. 26 refs., 3 figs.

• OSTI ID: 621730
• Journal Information: Science, Journal Name: Science Journal Issue: 5354 Vol. 279; ISSN SCIEAS; ISSN 0036-8075
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BARIUM OXIDES
COPPER OXIDES
HIGH-TC SUPERCONDUCTORS
JOSEPHSON EFFECT
PENETRATION DEPTH
THALLIUM OXIDES
TUNNEL EFFECT