One and two electron processes in 0. 9 keV/u to 60 keV/u Ar[sup 16+]+He collisions

Conference · Sat Jun 05 04:00:00 EDT 1993 · AIP Conference Proceedings (American Institute of Physics); (United States)

OSTI ID:6214549

Wu, W; Giese, J P; Richard, P; Stockli, M; Ali, R; Cocke, C L; Schoene, H ^[1]

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1. J. R. Macdonald Laboratory, Kansas State University, Manhattan, Kansas 66506-2604 (United States)

We have studied one- and two-electron processes in the collision of 0.9 to 60 keV/u Ar[sup 16+] on He target using the KSU CRYEBIS facility. The cross sections for single and double captures, single ionization, and transfer ionization were measured by observing the final Ar charge states in coincidence with the recoiling He ions. Single capture (SC) is dominant and relatively independent of projectile energy. Single ionization (SI) is very small but spans the measured energies. Transfer ionization (TI) dominates the two-electron processes and slowly increases with energy. Double capture (DC) is much smaller and independent of the projectile energy. The average Q-values were also determined by measuring the momentum of the recoil ions. The average Q-values for both SC and TI were found to decrease with increasing projectile energy.

• OSTI ID: 6214549
• Report Number(s): CONF-920948--
• Conference Information: Journal Name: AIP Conference Proceedings (American Institute of Physics); (United States) Journal Volume: 274:1
• Country of Publication: United States
• Language: English

Related Subjects

664300* -- Atomic & Molecular Physics-- Collision Phenomena-- (1992-)
74 ATOMIC AND MOLECULAR PHYSICS
ARGON IONS
ATOM COLLISIONS
CAPTURE
CHARGED PARTICLES
COINCIDENCE METHODS
COLLISIONS
COUNTING TECHNIQUES
ELECTRON CAPTURE
ELEMENTS
ENERGY RANGE
FLUIDS
GASES
HELIUM
ION COLLISIONS
ION-ATOM COLLISIONS
IONS
KEV RANGE
MULTICHARGED IONS
NONMETALS
RARE GASES
RECOILS