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Measurements of the injection-locking influence on the frequency noise spectrum of single-mode semiconductor lasers

Journal Article · · Opt. Lett.; (United States)
DOI:https://doi.org/10.1364/OL.10.000556· OSTI ID:6211706

The power spectral density of the instantaneous oscillation of single-mode semiconductors lasers under the influence of an external optical driving signal is directly measured for the first time of our knowledge. The experimental results show how the frequency noise of the slave is influenced by the value of the injected power and by the difference between the emission frequencies of the master and slave optical cavities and how it is correlated to the noise properties of both the master and the free-running slave.

Research Organization:
Fondazione Ugo Bordoni, Viale di Trastevere 108, 00153 Roma, Italy
OSTI ID:
6211706
Journal Information:
Opt. Lett.; (United States), Journal Name: Opt. Lett.; (United States) Vol. 10:11; ISSN OPLED
Country of Publication:
United States
Language:
English

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