Measurements of the injection-locking influence on the frequency noise spectrum of single-mode semiconductor lasers
                            Journal Article
                            ·
                            
                            · Opt. Lett.; (United States)
                            
                        
                    The power spectral density of the instantaneous oscillation of single-mode semiconductors lasers under the influence of an external optical driving signal is directly measured for the first time of our knowledge. The experimental results show how the frequency noise of the slave is influenced by the value of the injected power and by the difference between the emission frequencies of the master and slave optical cavities and how it is correlated to the noise properties of both the master and the free-running slave.
- Research Organization:
- Fondazione Ugo Bordoni, Viale di Trastevere 108, 00153 Roma, Italy
- OSTI ID:
- 6211706
- Journal Information:
- Opt. Lett.; (United States), Journal Name: Opt. Lett.; (United States) Vol. 10:11; ISSN OPLED
- Country of Publication:
- United States
- Language:
- English
Similar Records
                                
                                
                                    
                                        
                                        Measurements of the injection-locking influence on the frequency noise spectrum of single-mode semiconductor lasers
                                        
Frequency and intensity noise in injection-locked semiconductor lasers: Theory and experiments
Noise analysis of injection-locked semiconductor injection lasers
                        
                                            Journal Article
                                            ·
                                            Thu Oct 31 23:00:00 EST 1985
                                            · Opt. Lett.; (United States)
                                            ·
                                            OSTI ID:6339570
                                        
                                        
                                        
                                    
                                
                                    
                                        Frequency and intensity noise in injection-locked semiconductor lasers: Theory and experiments
                                            Journal Article
                                            ·
                                            Fri Feb 28 23:00:00 EST 1986
                                            · IEEE J. Quant. Electron.; (United States)
                                            ·
                                            OSTI ID:5770346
                                        
                                        
                                        
                                    
                                
                                    
                                        Noise analysis of injection-locked semiconductor injection lasers
                                            Journal Article
                                            ·
                                            Thu May 01 00:00:00 EDT 1986
                                            · IEEE J. Quant. Electron.; (United States)
                                            ·
                                            OSTI ID:5815524