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Indentation of silicate-glass films on Al[sub 2]O[sub 3] substrates

Journal Article · · Journal of the American Ceramic Society
; ; ;  [1]
  1. Univ. of Minnesota, Minneapolis, MN (United States). Dept. of Chemical Engineering and Materials Science
The deformation of thin layers of glass on crystalline materials has been examined using newly developed experimental methods for nanomechanical testing. Continuous films of anorthite (CaAl[sub 2]Si[sub 2]O[sub 8]) were deposited onto Al[sub 2]O[sub 3] surfaces by pulsed-laser deposition. Mechanical properties such as Young's modulus and hardness were probed with a high-resolution depth-sensing indentation instrument. Nanomechanical testing, combined with AFM in situ imaging of the deformed regions, allowed force-displacement measurements and imaging of the same regions of the specimen before and immediately after indentation. This new technique eliminates any uncertainty in locating the indentation after unloading. Emphasis has been placed on examining how the Al[sub 2]O[sub 3] substrate crystallographic orientation will affect mechanical composite response of silicate-glass film/Al[sub 2]O[sub 3] system.
Sponsoring Organization:
DOE; USDOE, Washington, DC (United States)
DOE Contract Number:
FG02-92ER45465
OSTI ID:
6190733
Journal Information:
Journal of the American Ceramic Society, Journal Name: Journal of the American Ceramic Society Vol. 82:7; ISSN 0002-7820; ISSN JACTAW
Country of Publication:
United States
Language:
English