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Microstructure and microwave properties of YBCO thin films grown on MgO and SrTiO sub 3 by CVD

Journal Article · · Journal of Materials Research; (United States)
; ;  [1];  [2];  [3]; ;  [4]; ;  [5]
  1. Superconductor Technologies Inc., 460-F Ward Drive, Santa Barbara, California (USA)
  2. Department of Electronics, Nagaoka University of Technology, Nagaoka, Niigata 940-21 (Japan)
  3. Institute for Materials Research, Tohoku University, Sendai, Miyagi 980 (Japan)
  4. Technological Research Center, Riken Corporation, Kumagaya 810, Saitama 360 (Japan)
  5. Department of Physics, University of California-Los Angeles, Los Angeles, California (USA)
The microstructure and microwave properties of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} thin films grown on SrTiO{sub 3} (100) and MgO (100) substrates by chemical vapor deposition have been studied. Both 100 GHz cavity measurement of surface resistance and ground plane substitution in a 5 GHz microstrip resonator show that films on SrTiO{sub 3} have better microwave properties than those on MgO. Although there are some {ital a}-axis grains and secondary phases on the surface, a large fraction of each film on SrTiO{sub 3} is epitaxial with its {ital c} axis normal to the substrate. The 100 GHz surface resistance of these films is less than copper for temperature {le}82 K, and approaches the detection limit at 10--20 K. For the films on MgO, {ital c}-axis grains of different in-plane rotation are found together with some {ital a}-axis needle-like grains. The grain boundaries are detrimental to the microwave properties, and the resulting surface resistance at 100 GHz and 10--20 K is about 20 m{Omega} higher than that of films on SrTiO{sub 3}.
OSTI ID:
6190474
Journal Information:
Journal of Materials Research; (United States), Journal Name: Journal of Materials Research; (United States) Vol. 6:11; ISSN JMREE; ISSN 0884-2914
Country of Publication:
United States
Language:
English