Minimum detection limit determination for the static SIMS analysis of environmental samples contaminated with tributyl phosphate
- Idaho National Engineering Lab., Idaho Falls, ID (United States)
Static secondary ion mass spectrometry (SIMS) has been demonstrated in this laboratory to be effective in the direct surface analysis of organic contaminants such as organophosphates adsorbed on mineral surfaces, vegetation, filters, and other environmental samples. Static SIMS is attractive for these applications due to the rapidness of the analysis which includes no sample preparation. Although static SIMS is a qualitative technique, minimum detection limit (MDL) information is critical to its application for screening environmental samples for contamination. Difficulties associated with determining MDL`s for static SIMS are similar to most other surface analysis methods which include unavailability of standards for quantification for most {open_quotes}real world{close_quotes} samples, ill-defined surface areas. The focus of this paper centers on determination of MDL`s for the detection of tributyl phosphate (TBP) on soils. Two different types of soils were investigated in order to compare the effect of soil type on the MDL for TBP. In surface analysis, the MDL is expressed in terms of the mass of the analyte divided by the surface area of the sample. The detection of TBP on soils is of considerable interest to DOE in its clean-up efforts at various sites as it was widely used in the DOE complex to extract U, Pu, Th, Np, and Am. Although TBP has limited toxicity, it may be useful as an indicator for the presence of Pu, U, and other contaminants at DOE burial sites.
- OSTI ID:
- 61895
- Report Number(s):
- CONF-9405234--
- Country of Publication:
- United States
- Language:
- English
Similar Records
Static SIMS desorption of tributyl phosphate from mineral surfaces: Effect of Fe(II)
Static SIMS desorption of tributyl phosphate from mineral surfaces: Effect of Fe(II)