An ultrahigh vacuum scanning tunneling microscope for surface science studies

Journal Article · Sat Dec 01 04:00:00 UTC 1990 · Review of Scientific Instruments; (USA)

DOI:https://doi.org/10.1063/1.1141551· OSTI ID:6184732

Zeglinski, D M; Ogletree, D F; Beebe, Jr, T P; Hwang, R Q; Somorjai, G A; Salmeron, M B ^[1]

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1. Department of Chemistry, University of California, Berkeley, CA (USA) Center for Advanced Materials, Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, Berkeley, CA (USA)

We describe the construction and operation of a scanning tunneling microscope designed in our laboratory that fits standard ultrahigh vacuum (UHV) systems as an add-on instrument. Sample motion is accomplished by electrical signals, eliminating mechanical feedthroughs. Samples are easily transferred to a modified Varian manipulator for heating and interfacing with other surface science techniques. {ital In} {ital situ} tip replacement and sample transfer in and out of the UHV system is also possible.

• OSTI ID: 6184732
• Journal Information: Review of Scientific Instruments; (USA), Journal Name: Review of Scientific Instruments; (USA) Vol. 61:12; ISSN RSINA; ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

440800* -- Miscellaneous Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
DESIGN
ELECTRON MICROSCOPES
HEATING
MECHANICAL VIBRATIONS
MICROSCOPES
MOTION
PERFORMANCE
SAMPLE HOLDERS
ULTRAHIGH VACUUM