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Observation of differences between low-energy electron- and positron-diffraction structural determinations of the cleavage faces of CdSe

Journal Article · · Phys. Rev. Lett.; (United States)

Low-energy positron diffraction (LEPD) is used in conjunction with low-energy electron diffraction (LEED) to determine the relaxed atomic geometries of the CdSe cleavage surfaces. The LEPD analyses yield optimal fits at smaller top-layer perpendicular relaxations than LEED for both cleavage faces, and significantly better agreement between theoretical and experimental intensity profiles.

Research Organization:
Department of Physics, Brandeis University, Waltham, Massachusetts 02254
OSTI ID:
6182205
Journal Information:
Phys. Rev. Lett.; (United States), Journal Name: Phys. Rev. Lett.; (United States) Vol. 62:16; ISSN PRLTA
Country of Publication:
United States
Language:
English