Al K x-ray production for incident /sup 16/O ions: The influence of target thickness effects on observed target x-ray yields
Thin solid Al targets ranging in thickness from approx. 1 to 30 ..mu..g/cm/sup 2/ were bombarded by /sup 16/O ions wih incident energies from 0.25 to 2.25 MeV/amu. The effects of target thickness on the measured Al K x-ray yield for ions incident without an initial K-shell vacancy were determined. Comparisons of the data for Al K x-ray production in vanishingly thin targets (and 29-..mu..g/cm/sup 2/ targets) were made to perturbed-stationary-state calculations (PSS) for O ions on Al targets. The PSS calculations contained corrections for Coulomb deflection and binding energy (PSS(CB)) and for Coulomb deflection, binding energy, and polarization (PSS(CBP)). Further, two different PSS calculation procedures were employed: calculations without radial cutoffs employed in the binding-energy contribution (PSS), and calculations with radial cutoffs employed in the binding-energy correction (NPSS). The PSS(CBP) calculations agree with the measured Al K x-ray production cross section for data taken in the limit of a vanishingly thin target. The NPSS(CBP) calculations agree with the data taken for a 29-..mu..g/cm/sup 2/ Al target. The latter agreement is fortuitous, as the increase observed in the measured target x-ray yield for the 29-..mu..g/cm/sup 2/ target, in comparison to the yield extracted as rhox ..-->.. 0 at each bombarding energy, is due to K-shell--to--K-shell charge exchange. Comparisons are made with previously published data for /sup 16/O ions incident on finite-thickness Al targets.
- Research Organization:
- Department of Physics, Kansas State University, Manhattan, Kansas 66506
- OSTI ID:
- 6177544
- Journal Information:
- Phys. Rev., A; (United States), Vol. 19:4
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
GENERAL PHYSICS
ALUMINIUM
ION COLLISIONS
OXYGEN IONS
COLLISIONS
FOILS
K SHELL
KEV RANGE 100-1000
MEV RANGE 01-10
OXYGEN 16 BEAMS
PSS METHOD
THICKNESS
X-RAY SPECTRA
BEAMS
CHARGED PARTICLES
DIMENSIONS
ELECTRONIC STRUCTURE
ELEMENTS
ENERGY RANGE
ION BEAMS
IONS
KEV RANGE
METALS
MEV RANGE
SPECTRA
640301* - Atomic
Molecular & Chemical Physics- Beams & their Reactions