Space surveillance application potential of Schottky barrier IR sensors. Technical report
Technical Report
·
OSTI ID:6177453
Schottky-barrier IR detection is based on the principle of internal photoemission at the surface between a Si substrate and a deposited metal. In a multi-element focal plane array (FPA), this phenomenon provides very high pixel-to-pixel uniformity, so the requirement for corrective signal processing is minimal. The use of standard silicon design and fabrication techniques simplifies detector readout and multiplexing functions and permits practical realization of sensors that contain very large staring focal planes. This report summarizes the status of FPA and camera development and includes typical imagery. For surveillance applications, the high sensitivity obtainable with these large staring arrays offers both signature and background phenomenology opportunities in the medium wavelength (MWIR) band which could not be exploited previously with scanning-type sensors. Examples of predicted surveillance sensor performance include (1) a near-term ground-based system for Day/Night detection of low-altitude space objects and (2) a future space-borne system for space missions. It is concluded that significant potential exists for future application of this technology.
- Research Organization:
- Massachusetts Inst. of Tech., Lexington (USA). Lincoln Lab.
- OSTI ID:
- 6177453
- Report Number(s):
- AD-A-180848/4/XAB; TR-772
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
BALLISTIC MISSILE DEFENSE
CAMERAS
DEPOSITION
DETECTION
ELECTROMAGNETIC RADIATION
ELECTRON EMISSION
ELEMENTS
EMISSION
FABRICATION
GROUND LEVEL
INFRARED RADIATION
LEVELS
MEASURING INSTRUMENTS
METALS
NATIONAL DEFENSE
PHOTOELECTRIC EMISSION
RADIATION DETECTORS
RADIATIONS
SCHOTTKY BARRIER DIODES
SEMICONDUCTOR DETECTORS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SEMIMETALS
SILICON
SUBSTRATES
SURVEILLANCE
47 OTHER INSTRUMENTATION
BALLISTIC MISSILE DEFENSE
CAMERAS
DEPOSITION
DETECTION
ELECTROMAGNETIC RADIATION
ELECTRON EMISSION
ELEMENTS
EMISSION
FABRICATION
GROUND LEVEL
INFRARED RADIATION
LEVELS
MEASURING INSTRUMENTS
METALS
NATIONAL DEFENSE
PHOTOELECTRIC EMISSION
RADIATION DETECTORS
RADIATIONS
SCHOTTKY BARRIER DIODES
SEMICONDUCTOR DETECTORS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SEMIMETALS
SILICON
SUBSTRATES
SURVEILLANCE