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An ultra high throughput ADC

Conference · · IEEE Trans. Nucl. Sci.; (United States)
OSTI ID:6177210
An ultra high throughput ADC for use with high resolution photon detectors has been developed. The ADC has 13 bit resolution with less than 0.7% differential non-linearity. A 12 bit, commercially available, hybrid ADC circuit has been used with a two step conversion technique. Improved version of the Gatti slider technique is also used to improve the differential non-linearity. Conversion time of 2 micro second is achieved.
Research Organization:
SEIKO EG and G Co., Ltd., Tokyo (JP)
OSTI ID:
6177210
Report Number(s):
CONF-881103-
Conference Information:
Journal Name: IEEE Trans. Nucl. Sci.; (United States) Journal Volume: 36:1
Country of Publication:
United States
Language:
English

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