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U.S. Department of Energy
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Utility of replica techniques for x-ray microanalysis of second phase particles

Conference ·
OSTI ID:6175370
X-ray microanalysis of second phase particles in ion-milled or electropolished thin foils is often complicated by the presence of the matrix nearby. Extraction replica techniques provide a means to avoid many of the complications of thin-foil analyses. In this paper, three examples of the analysis of second phase particles are described and illustrate the improvement obtained by the use of extraction replicas for qualitative analysis, quantitative analysis, and analysis of radioactive specimens.
Research Organization:
Oak Ridge National Lab., TN (USA)
DOE Contract Number:
AC05-84OR21400
OSTI ID:
6175370
Report Number(s):
CONF-840767-13; ON: DE85005564
Country of Publication:
United States
Language:
English