Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Neutron irradiation effects on AlGaAs/GaAs heterojunction bipolar transistors

Conference · · IEEE Trans. Nucl. Sci.; (United States)
OSTI ID:6166067
AlGaAs/GaAs heterojunction bipolar transistors irradiated with 10/sup 15/ neutrons/cm/sup 2/ demonstrated superior performance to silicon bipolar transistors. The post neutron current gain was dominated by recombination in the emitter-base depletion region. The base current exhibited an ideality factor n > 2 after irradiation, which was attributed to two possible recombination mechanisms associated with neutron induced traps: tunneling-assisted trapping and recombination arising from a nonuniform distribution of Shockley-Read-Hall centers within the depletion region. The emitter-base heterojunction was degraded more than the collector-base homojunction after irradiation.
Research Organization:
Harris Semiconductor, Melbourne, FL (US); Univ. of California at Santa Barbara, Dept. of Electrical Engineering, Santa Barbara, CA (US)
OSTI ID:
6166067
Report Number(s):
CONF-880730-
Conference Information:
Journal Name: IEEE Trans. Nucl. Sci.; (United States) Journal Volume: 35:6
Country of Publication:
United States
Language:
English