Dependence of fluxon dynamics on loaded terminations in long overlap Josephson junctions
Journal Article
·
· J. Appl. Phys.; (United States)
Fluxon motion in long overlap-geometry Josephson junctions influenced by loaded terminations is investigated. The combination of results from a perturbation method with an approximate expression for the emitted power yields equations describing the fluxon dynamics. The form of the first zero field step is presented for various parameters and the emitted power is calculated.
- Research Organization:
- NIRO Atomizer, Research Development System and Design Division, Gladsaxevej, DK-2860 Soeborg, Denmark
- OSTI ID:
- 6157111
- Journal Information:
- J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 54:5; ISSN JAPIA
- Country of Publication:
- United States
- Language:
- English
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