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Sputtered films of superconducting SmRh/sub 4/B/sub 4/

Journal Article · · Phys. Rev. B: Condens. Matter; (United States)
Films of the coexistent antiferromagnetic superconductor SmRh/sub 4/B/sub 4/ have been made by sputtering. These films have been characterized by x-rays and superconducting critical temperatures T/sub c/, fields, and currents. Our best films have residual resistance ratios, r/sub R/, as high as or higher than for films of ErRh/sub 4/B/sub 4/ reported in the literature, and the highest T/sub c/ is 2.36 K. We find an anomalous dependence of T/sub c/ on r/sub R/, and offer two possible explanations (proximity-effect and disorder-enhanced spin-flip scattering), as well as propose a radiation-damage experiment to distinguish between these. The antiferromagnetic ordering temperature is shown to decrease with film disorder as does the ferromagnetic ordering temperature in radiation-damaged ErRh/sub 4/B/sub 4/. We find an approximately 1000-A-thick RhAl impurity phase at the sapphire-substrate/film interface which seems to result from a reaction with the substrate. The potential importance of RhAl and trace impurity phases on present measurements and planned tunneling experiments are discussed in detail. Finally, the full critical-field curves are presented along with an explanation of why the low-temperature values are independent of T/sub c/.
Research Organization:
Materials Science and Technology Division, Argonne National Laboratory, Argonne, Illinois 60439
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
6156901
Journal Information:
Phys. Rev. B: Condens. Matter; (United States), Journal Name: Phys. Rev. B: Condens. Matter; (United States) Vol. 30:9; ISSN PRBMD
Country of Publication:
United States
Language:
English

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